The Doctoral School  "Unravelling Advanced 2D Materials (TU-D)", under the direction of Florian Libisch,, opens an external URL in a new window has set itself the task of training the next generation of scientists in the field of 2D materials at the future state of the art. Through the collaboration of the world-class expertise available at TU Wien, including the Analytical Instrumentation Center, a doctoral program has been established, in which Francesco Laudani, opens an external URL in a new window is researching a sub-project. Francesco has been working at the AIC since October 2023 and is working on the surface and interface analysis of MoS2. Annette Foelske, opens an external URL in a new window, who is also head of the Analytical Instrumentation Centre, is responsible for the supervision. The majority of the samples to be analysed are provided by the team of the Institute of Photonics under Thomas Müller, opens an external URL in a new window. 

Goals

  • XP and Auger-Meitner electron spectroscopy of commercially exfoliated and CVD-grown MoS2, to obtain a solid spectra database
  • Manipulation of MoS2 by ions and heat and subsequent investigation of the changes in the XP and Auger-Meitner spectra, such as chemical changes, charge phenomena, van der Waals interactions or thermal desorption of adsorbates
  • Manufacture of MoS2-based electronic components for in-situ XPS analysis in an ultra-high vacuum
  • Characterisation and manipulation of device performance and correlation of results with in-situ XPS data

Methods

  • X-ray photoelectron spectroscopy (XPS) to determine the chemical composition of surfaces using the SPECS u-Focus XPS and Versa Probe III XPS  
  • Parallel angle-resolved X-ray photoelectron spectroscopy (PAR-XPS) using the SPECS u-Focus XPS for the non-destructive investigation of depth profiles with an information depth of less than 10 nm
  • Auger-Meitner electron spectroscopy (AMES) to determine the element distributions on the surface using the PHI 710 AES
  • Sputtering of surfaces for cleaning and depth profiling in the SPECS u-Focus XPS (Argon ion source), Versa Probe III XPS (Argon ion source and Argon cluster source) and PHI 710 AES (Argon ion source and focussed ion beam)
  • Energy dispersive spectroscopy (EDS) using the PHI 710 AES
  • Heating, cooling and contacting the sample for in situ experiments in the SPECS u-Focus XPS (heating and cooling), Versa Probe III XPS (heating, cooling and contacting) and PHI 710 AES (heating and contacting)