Structure & Analytics

Techniques / Methods

  • Elemental analysis: EPMA, EELS
  • Structural analysis: TEM, XRD, lattice defects
  • Imaging methods
  • Development of new analytical methods

Instruments

  • Electron microscopes (scanning and transmission electron microscopes)    
  • Photoelectron spectrometers
  • X-ray diffractometer
  • X-ray fluorescence spectrometer
  • Atomic force microscope
X-ray diffraction  - XRD

© IFP

X-ray diffraction - XRD

An X-ray diffractometer is used to study the structure of crystalline phases in solids. The angles and intensities of the diffracted X-rays are measured.

Atomic Force Microscope - AFM

© IFP

Atomic Force Microscope - AFM

An atomic force microscope is used for the scanning of surfaces and the measurement of atomic forces in the nanometer range. A nanoscopically fine needle is pressed against the sample to be measured by means of a leaf spring. The atomic forces bend the leaf spring and the resulting deflection can be measured with light to calculate the force acting between the atoms of the surface and the tip.