Teachings

Dissertation Title

Single Event Transients in 90 nm CMOS

Supervisor

Curriculum Vitae

Education

1988 - 1992

Elementary School in Vienna, Austria

1992 - 1996

Grammar School in Vienna, Austria

1996 - 2001

HTL, Department for Telecommunication, Vienna, Austria

2002 - 2016

TU Wien, Faculty of Electrical Engineering

2003 - present

TU Wien, Faculty of Technical Physics

2008

Bachelor of Science in Electrical Engineering (with honors)

2011

Master of Science in Electrical Engineering (with honors)
Diploma thesis title “Design and Analysis of Techniques for the Correction of the Systematic Errors of a 3D-Sensor Chip”

2011 - 2016

Pursuing a Ph.D. at TU Wien Institute of Electrodynamics, Microwave and Circuit Engineering
Field of investigation: optical distance measurement

2017

Promotio sub auspiciis praesidentis (i. e. Dr.-techn. degree with highest possible honors)

Professional experience

2000

ILL (Institut Laue-Langevin) in Grenoble, France, 2 month Employed at the Institute of Atomic and Subatomic Physics in Vienna, Austria

2001

ILL (Institut Laue-Langevin) in Grenoble, France, 2 month

2002

RAL (Rutherford Appleton Laboratory), Harwell Oxford, England, 2 weeks

2003

Institute of Atomic and Subatomic Physics in Vienna, Austria, 2 month

2004

ILL (Institut Laue-Langevin) in Grenoble, France, 2 month
Employed at the Institute of Atomic and Subatomic Physics in Vienna, Austria

2005 - 2011

Student employee at Institute of Electrodynamics, Microwave and Circuit Engineering, TU Wien

2011 - 2013

Project Assistant, TU Wien 

2013 - 2014

University Assistant, TU Wien 

2014 - 2016

Project Assistant, TU Wien

2016 - present

University Assistant, TU Wien 

Scientific fields of interest

  • Optoelectronic integrated devices and circuits, photonics
  • Single-photon detection
  • Semiconductor simulations: TCAD (2D&3D), Medici (2D)
  • Radiation effects in electronics
  • Optical distance measurement sensors (time of flight and interferometric)
  • 3D cameras
  • Electronic-photonic integration
  • Automation of measurement setups
  • Characterisation and measurement techniques