31. October 2023, 16:00 until 17:00

Maurizio De Santis, Institut Néel, CNRS, Université Grenoble Alpes, Grenoble/France

Seminar

Structure of epitaxial thin oxide films investigated in situ by x-ray diffraction using synchrotron radiation

Combining Grazing Incidence X-Ray Diffraction (GIXRD) and X-Ray Reflectivity (XRR) allows to solve the structure of crystal surfaces and epitaxial ultrathin films, and to investigate thin films growth. After a general introduction to the technique, I will show some studies of oxide films. The first example concerns the growth mode and the structure of an ultrathin MgO film on Ag(001). MgO ultrathin films are employed as decoupling layers between metallic substrates and electronic states of molecules or atoms deposited on top. In the following I will discuss the growth of CuO and TiO2-anatase films on SrTiO3(001), both obtained through a post-deposition annealing in oxygen. These films are investigated for their multiferroic and catalytic properties, respectively. The measurements I will show were performed on the French BM32 beamline at the European Synchrotron Radiation Facility (ESRF).

Calendar entry

Event location

SEM.R. DB gelb 05 B
1040 Wien
Wiedner Hauptstraße 8-10/E134

 

Organiser

IAP
Manuela Marik
marik@iap.tuwien.ac.at

 

More Information

https://tuwien.zoom.us/j/69594421567?pwd=a2htSnNENUpMUFV4OEhXckxrM1Azdz09

 

Public

Yes

 

Entrance fee

No

 

Registration required

No